Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy
SW Hell, J Wichmann - Optics letters, 1994 - opg.optica.org
SW Hell, J Wichmann
Optics letters, 1994•opg.optica.orgWe propose a new type of scanning fluorescence microscope capable of resolving 35 nm in
the far field. We overcome the diffraction resolution limit by employing stimulated emission to
inhibit the fluorescence process in the outer regions of the excitation point-spread function.
In contrast to near-field scanning optical microscopy, this method can produce three-
dimensional images of translucent specimens.
the far field. We overcome the diffraction resolution limit by employing stimulated emission to
inhibit the fluorescence process in the outer regions of the excitation point-spread function.
In contrast to near-field scanning optical microscopy, this method can produce three-
dimensional images of translucent specimens.
We propose a new type of scanning fluorescence microscope capable of resolving 35 nm in the far field. We overcome the diffraction resolution limit by employing stimulated emission to inhibit the fluorescence process in the outer regions of the excitation point-spread function. In contrast to near-field scanning optical microscopy, this method can produce three-dimensional images of translucent specimens.
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